Abstract:
One of the factors that accounts for the low yields in common bean is the simultaneous occurrence of diseases on
the common bean crop. Bean root rots and anthracnose are the most important common bean diseases that
simultaneously occur on the bean crop in Uganda. Moreover, Colletotrichum lindemuthianum, the pathogen that
causes bean anthracnose, possesses a high genetic variability which makes it easily break down single gene
resistance. Pyramiding resistance genes for both diseases in commercial varieties would ensure reduction of
yield losses resulting from the two diseases. However, the effect of marker assisted gene pyramiding on plant
agronomic characters is not well understood. Three-way crosses were made to pyramid three anthracnose and
one Pythium root rot resistance genes in four susceptible market class varieties. Sequence characterized
amplified regions (SCAR) markers were used to facilitate the pyramiding scheme. Correlation analysis and Path
coefficient analysis were used to assess the association between number of pyramided genes and different plant
agronomic characters. Number of pyramided genes was negatively correlated with number of pods per plant
(-0.32), number of seeds per plant (-0.25), number of seeds per pod (-0.18), pod length (-0.17), days to 50%
flowering (-0.09) and 100-seed weight (-0.02). Path coefficient analysis showed that number of pyramided genes,
plant height, days to 50% flowering, number of seeds per pod and number of pods per plant had negative direct
effects on seed weight per plant. Number of seeds per plant had the highest positive direct effects (0.98)
followed by 100-seed weight (0.28) while days to maturity had the least positive direct effect (0.03) on seed
weight per plant. Only number of seeds per plant had its correlation coefficient (0.94) almost equal to the direct
path coefficient (0.97). Number of pyramided genes had significant (P < 0.05) negative indirect effect on seed weight per plant only through number of seeds per plant (-0.25). Therefore, pyramiding higher numbers of
resistance genes may cause a grain yield reduction via number of seeds per plant. Therefore, it is important for
breeders to simultaneously select for number of pyramided genes with number of seeds per plant and other
highly associated traits.
Language:
English
Date of publication:
2015
Country:
Region Focus:
East Africa
University/affiliation:
Link to journal
Journal:
Volume:
7
Number:
3
Pagination:
98-104
Collection:
RUFORUM Journal Articles
Agris Subject Categories:
Additional keywords:
Licence conditions:
Open Access
Form:
Web resource
Publisher:
ISSN:
1916-9752
E_ISSN:
1916-9760
Edition: